Yamaichi Electronics launches 0.35mm pitch test contactor


Yamaichi Electronics has introduced new test contactors within its YED254 and YED274 series for testing ultra-fine pitch semiconductor devices.

New semiconductor devices such as wafer level CSPs for mobile applications have ball pitches of 0.35mm. The TCs can be custom designed for different dimensions. A homogenous force distribution on the device surface is important to avoid device cracking. It is designed with compression mount technology, therefore no soldering is needed.

November 3, 2015


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John joined UKi Media & Events in 2012 and has worked across a range of B2B titles within the company's automotive, marine and entertainment divisions. Currently editor of Automotive Testing Technology International, Crash Test Technology International and Electric & Hybrid Marine Technology International, John co-ordinates the day-the-day operations of each magazine, from commissioning and writing to editing and signing-off, as well managing web content. Aside from the magazines, John also serves as co-chairman of the annual Electric & Hybrid Marine Awards and can be found sniffing out stories throughout the halls of several of UKI's industry-leading expo events.

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