Newage launches next generation Versitron hardness tester


Newage has launched the new generation Versitron series Rockwell hardness testing system, which provides top-loading and test surface referencing technology. Applying both the pre-load and full load in one single test cycle makes it possible to perform a test in as little as four seconds.

The system now has a full color, icon-driven display that facilitates easy and intuitive navigation. Test results are shown in a large font size making them easy to read, and they are easily converted into other hardness scales and can be exported directly to DataView for further analysis or as a CSV file.

The Versitron series Rockwell hardness tester records and stores test data and can provide on screen statistics such as X-charts, ranges and max/min during the test.

It also features an elastic member loading system, which produces a natural dampening effect in the application of all loads, eliminating the need for dashpots and other load impact controlling devices.

The top-loading and test surface referencing test process makes testing as simple as pulling a lever, and serves to reduce or eliminate part deflection and operator influence during each test. The unique indenter shroud secures that the test surface reference is constant and remains unaffected by dirt or foreign objects.

June 4, 2015


About Author


John joined UKi Media & Events in 2012 and has worked across a range of B2B titles within the company's automotive, marine and entertainment divisions. Currently editor of Automotive Testing Technology International, Crash Test Technology International and Electric & Hybrid Marine Technology International, John co-ordinates the day-the-day operations of each magazine, from commissioning and writing to editing and signing-off, as well managing web content. Aside from the magazines, John also serves as co-chairman of the annual Electric & Hybrid Marine Awards and can be found sniffing out stories throughout the halls of several of UKI's industry-leading expo events.

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