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Active Safety

R&S verifies NXP’s next-generation radar sensor reference design

Rachel EvansBy Rachel EvansJanuary 3, 20242 Mins Read
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NXP chose the R&S RTS radar test system to verify its radar sensor reference design based on the industry’s first 28nm RFCMOS one-chip radar SoC

Rohde & Schwarz has verified NXP’s next-gen automotive radar sensor reference design for extremely short object distances. Engineers from both companies conducted a comprehensive series of tests to validate the design, which is based on NXP’s 28nm RFCMOS radar one-chip SoC (SAF85xx).

The R&S RTS radar test system combines the R&S AREG800A automotive radar echo generator with the R&S QAT100 antenna mmW frontend. This combination is said to offer unique short-distance object simulation capabilities as well as superior RF performance and advanced signal processing with many advanced functions. This enables realistic tests of next-generation automotive radar applications and brings the automotive industry’s vision of fully autonomous driving one step closer.

NXP’s radar sensor reference design can be used for short-, medium- and long-range radar applications to serve challenging NCAP safety requirements as well as comfort functions like highway pilot or urban pilot for the fast-growing segment of L2+ and L3 vehicles.

“We have been collaborating closely and successfully with Rohde & Schwarz for many years on the verification of our automotive radar sensor reference designs. Rohde & Schwarz’ cutting-edge automotive radar test systems allows us high-quality and highly efficient validation of our automotive radar products and proves outstanding performance of our radar one-chip. The level of experience, quality and support that Rohde & Schwarz provides to NXP is making a difference,” said Adi Baumann, senior director of ADAS R&D at NXP Semiconductors.

Gerald Tietscher, vice president signal generators, power supplies and meters from Rohde & Schwarz, commented, “We are grateful for the collaboration with NXP to accelerate the deployment of advanced automotive radar sensors based on 28nm automotive radar chips. They serve ever more challenging NCAP safety requirements and will help enable new safety applications. Our experience in automotive radar testing allows us to provide a best-in-class test solution for this radar sensor design based on the industry’s first 28nm RFCMOS one-chip radar SoC.”

NXP will present the latest developments for radar including the automotive radar sensor reference design at CES in Las Vegas, Nevada from January 9 to 12, 2024.

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Rachel Evans

Rachel's career in journalism has seen her write for various titles at UKi Media & Events within automotive, tire and marine. Currently editor of ATTI, her favourite aspect of the job is interviewing industry experts, including researchers, scientists, engineers and technicians, and learning more about the groundbreaking technologies and innovations that are shaping the future of transportation.

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