EtherCAT Conformance Test Tool version 2.0 offers extended functionality

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The EtherCAT Technology Group’s (ETG) technical working group Conformance has released version 2.0 of the EtherCAT Conformance Test Tool (CTT), which features a significantly extended test set for EtherCAT devices.

Manufacturers of EtherCAT slaves especially benefit from the new version, which is distinguished mainly by new functionalities for device configuration and EtherCAT development. Additionally, fully automated testing of EtherCAT devices in distributed clocks (DC) mode is now available.

The EtherCAT Conformance Test Tool is the official reference tool for specifying compliant implementation of EtherCAT technology into EtherCAT slaves. The CTT enables the hundreds of EtherCAT device manufacturers to ensure reliable interoperability in the field.

With the updates in version 2.0, central extensions become available. Over and above the main job of the tool, which is to conduct device tests and detect possible errors, CCT 2.0 greatly extends functionalities that support and simplify EtherCAT development. This includes the ESI editor, which can be used to edit the device description file, SII control to generate the EEPROM content, as well as additional functionalities such as the ability to upload the object dictionary from the device and save it for the ESI.

July 19, 2016

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John joined UKi Media & Events in 2012 and has worked across a range of B2B titles within the company's automotive, marine and entertainment divisions. Currently editor of Automotive Testing Technology International, Crash Test Technology International and Electric & Hybrid Marine Technology International, John co-ordinates the day-the-day operations of each magazine, from commissioning and writing to editing and signing-off, as well managing web content. Aside from the magazines, John also serves as co-chairman of the annual Electric & Hybrid Marine Awards and can be found sniffing out stories throughout the halls of several of UKI's industry-leading expo events.

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