The new series of DLM5000HD high-definition oscilloscopes from Yokogawa Test & Measurement support the testing of next-generation automotive electronics.
The high-performance version of the DLM5000 series, this line of oscilloscopes offers frequency bandwidths of 500MHz and 350MHz, which delivers more accurate waveform analysis. The DLM5000HD portfolio consists of two eight-channel models (500MHz DLM5058HD and 350MHz DLM5058HD) and two four-channel models (500MHz DLM5054HD and 350MHz DLM5034HD).
Yokogawa’s new oscilloscopes offer 12-bit vertical resolution that is 16 times higher than that of the DLM5000 series, for greater accuracy in waveform observation. This is particularly beneficial for developers of next-generation inverters, enabling the accurate observation of minute changes in high-speed signals, which enables detection of phenomena that can cause unexpected anomalies.
Another useful feature of the DLM5000HD series is that the time-saving serial bus analysis auto-setup function, which automatically sets the optimal bit rate and threshold level, can now also be used with previously captured waveforms. This means that auto-setup can even be used for low-frequency signals, improving the efficiency of in-vehicle bus development and evaluation work.
The DLM5000HD series is able to store up to one billion points of acquired data, twice that of the DLM5000 series. This enables users to store history data on up to 200,000 captured waveforms as history waveforms. In addition to doubling the number of waveforms that can be searched and compared using the long memory, this means a single device can measure the behavior of braking systems and other apparatuses that needs to be captured at a high sampling rate for several milliseconds, improving the efficiency of evaluation.
As with the DLM5000 series, measurements can be captured with up to 16 analog channels and 64 bits of logic (eight eight-bit logic channels) by using the dual-unit synchronous measurement (DLMsync) function to operate two eight-channel units. This enables the simultaneous measurement of both analog and logic signals to, for example, analyze numerous power-on sequences while debugging an electronic control unit.
